How to Avoid Pitfalls with Inline Particle Size Characterization - METTLER TOLEDO
 

How to Avoid Pitfalls with Inline Particle Size Characterization

This presentation discusses the implementation of particle characterization technology to maximize data integrity for easier process understanding and optimization. Enhanced particle resolution is achieved through the use of stuck particle correction enabling more intuitive data analysis which provides reliable, higher quality results - significantly improving ease of use and reducing the number of lost experiments.
Benjamin Smith
31 Minutes
English
How to Avoid Pitfalls with Inline Particle Size Characterization

All in situ optical characterization techniques risk a slight degree of probe fouling in concentrated solid suspensions. Fouling is compounded by supersaturation which occurs during crystallization and precipitation. Even when fouling is slight (1% of the probe window) optical measurement results are often skewed to the point where they are misleading and confusing. When this occurs data analysis is difficult, time consuming, and may result in costly incorrect conclusions or repeat experiments.

Three case studies are presented in this webinar:

  • Identify Multiple Nucleation Events During Anti-Solvent Addition
  • Understanding Particle Agglomeration Following Rapid Precipitation
  • Optimizing Seeded Crystallization by Understanding Growth Mechanism


Presenter
Benjamin Smith is a Chemical Engineer dedicated to the use of inline particle characterization technologies for the development, scale-up and manufacturing of processes. As a result, (bio) pharma, chemical and food companies bring products to market faster, at lower costs and with higher quality. Benjamin is currently a Market Manager at METTLER TOLEDO.